The new analysis-based data stitch function in CARTO Explore allows users of XM-60 and XL-80 laser systems to analyse stitched data to international standards. By adding this function to CARTO Explore, data captured from the XM-60 using the target-based measurement mode can now be easily stitched together and analysed for longer axes.
This added capability enables XL-80 laser system users to break down measurements of longer axes that are captured in noisy measurement environments, into smaller sections and stitch them together. This reduces the environmental effect on each section and increases the accuracy of the total measurement.
Dan Throup, Product Owner for Calibration Software, explained, “Adding data stitch for the XL-80 laser enables measurement of long axes in several short sections. This is particularly beneficial now short range straightness optics, with better performance, can be used for longer axis measurements.”
Renishaw will be demonstrating the CARTO software suite, its premium digital ecosystem for the company’s laser calibration products, at the EMO Hannover 2023 exhibition (hall 6, stand B32), Germany, from 18th – 23rd September. CARTO consists of three applications; Capture to collect laser measurement data, Explore for powerful analysis to international standards and Compensate for quick and easy error correction.
